Alumni Profile: Christopher Hampson
Chris Hampson (BS, Computer Science, 1990) is a Principal Engineer at Intel, the world’s largest producer of semiconductor chips, where he has been working for 17 years. He currently chairs a worldwide joint engineering team that focuses on Array testing.
Mr. Hampson joined Intel after working as a technician, memory designer and test engineer at Unisys, a global leader in providing information technology services and programs.
At Intel, Mr. Hampson has lead the Oregon CPU Array Design for Test Product Engineering team for the last 12 years. He is responsible for specifying, designing and validating the DFT (design for test) features that allow all of the memory elements on a microprocessor (instruction/data register areas, all levels of cache – 40-50 percent of the transistors on an Intel CPU) to be tested to a very high level of quality using the latest algorithmic and circuit level stability techniques in the memory test field.
Mr. Hampson also chairs a world-wide (Intel only) Joint Engineering Team to ensure that these methods and practices are performed on every device that Intel ships which contains embedded memory. He also chairs an internal yearly Design Test Technology Conference (held at the Oregon Convention Center, Portland) which is a collaboration forum for sharing these techniques with test professionals from all of Intel’s Design and Test centers around the world.